Abstract: This paper develops a degradation test scheme for insulated gate bipolar transistors (IGBTs) that are subjected to repeated electrostatic discharge (ESD). The proposed 7-step scheme is ...
Abstract: In this work, we undertake an electro-thermal performance analysis of an automotive traction inverter platform based on 1200V SiC MOSFET and 1200V Si IGBT / diode technology. The ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback